Oblast zaměření: Polovodiče
Komise : IEC/TC 47 (Semiconductor devices)
K připomínkám do: 29.04.2020
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This part of IEC 63XXX gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and space-related applications.

NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.

NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.