Tekutiny pro použití v elektrotechnice

Komise : IEC/TC 119 (Printed electronics)
Původce: ISO\IEC\CEN\CENELEC
K připomínkám do: 15.04.2020
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This part of IEC 62899 specifies a measuring method of contact resistance for the printed thin film transistor (TFT) by the transfer length method (TLM).

Komise : IEC/TC 119 (Printed electronics)
Původce: ISO\IEC\CEN\CENELEC
K připomínkám do: 15.04.2020
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This part of IEC 62899 specifies the optical measurement method for acquiring two-dimensional image of voids and obtaining attributes related to voids in the dried or cured printed patterns which are parts of electronic products in the field of printed electronics. In this document, void means imperfection of pattern observed from 2-dimensional(2D) top-view. The measurable voids using this standard is limited to those that are distinguishable by the optical image measurement

Komise : IEC/TC 119 (Printed electronics)
Původce: ISO\IEC\CEN\CENELEC
K připomínkám do: 15.04.2020
Zobraz více Zobraz méně
 

This part of IEC 62899 specifies a measuring method of contact resistance for the printed thin film transistor (TFT) by the transfer length method (TLM).This part of IEC 62899 specifies a measuring method of contact resistance for the printed thin film transistor (TFT) by the transfer length method (TLM).

Komise : IEC/TC 119 (Printed electronics)
Původce: ISO\IEC\CEN\CENELEC
K připomínkám do: 15.04.2020
Zobraz více Zobraz méně
 

This part of IEC 62899 specifies the optical measurement method for acquiring two-dimensional image of voids and obtaining attributes related to voids in the dried or cured printed patterns which are parts of electronic products in the field of printed electronics. In this document, void means imperfection of pattern observed from 2-dimensional(2D) top-view. The measurable voids using this standard is limited to those that are distinguishable by the optical image measurement